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Tekscope november 1972 issue (cd) 577 177 178 D1 D2 (+)


Poster: 1644927271@iowa-industrial.com

Tekscope november 1972 issue (cd) 577 177 178 D1 D2 (+)

Why settle for just one resolution? You get them both!
The ever popular and immensely useful TekScope series of articles are truly wonderful to have. This issue has been scanned onto CD in two resolutions. The first (very high resolution) is used for printing the most readable pages. The second (standard) resolution results in a much more compact PDF and is used for research and general information. It is text-searchable. Both PDFs are sent on the CD.
"Progress In Semiconductor Testing"
"Oscilloscope To Curve Tracer With One Plug-In"
(Sub headings: Testing Signal and Power Diodes, Testing Zener Diodes, Testing Tunnel Diodes, Testing Silicon Controlled Rectifiers and Silicon Controlled Switches, Testing NPN - PNP Transistors, Testing Field Effect Transistors.)
"Teknique: A Practical Approach To Differential Amplifiers and Measurements"
-mentions 453A 7A22 5A22N P6055
"Service Scope: Servicing The 5100-Series Display Units"
Unfortunately, in order to delay the inevitable plagiarism of this by "marketing' and "leeching" scanned manual CD distributors, we were forced to lock it against changes. However, it has not been locked against printing high resolution pages.





Tekscope november 1972 issue (cd) 577 177 178 D1 D2 (+)